IONTOF
ION-TOF is the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers (TOF-SIMS) for surface analysis.
TOF-SIMS is a very sensitive surface analytical technique, well established for many industrial and research applications. It provides detailed elemental and molecular information about the surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis. As a long-term technological leader in the field of TOF-SIMS instrumentation, ION-TOF is seen as a role model for the successful development of original university research into a professional business.
Since the technique became commercially viable ION-TOF has made many product improvements, and more than 140 instruments are in operation in industrial and academic laboratories worldwide. ION-TOF's success is based on the longstanding SIMS experience and skills of its scientists and engineers. Research in Nanoscience Projects
ION-TOF's scientists are not solely involved in developing equipment; basic research is also carried out. Consequently ION-TOF is part of different national and international research networks. The involvement in nanoscience projects enables ION-TOF to understand the instrumental requirements for nanoscience and to design them into its instruments. ION-TOF continues to make considerable development efforts. Its policy to build the most innovative ion beam technology for surface science, and the continued investment in the development will generate new possibilities for the application of TOF-SIMS and increase its value for the different fields of science.
ION-TOF and Nano2LifeWith the development of the cluster ion beam technology, TOF-SIMS instruments have entered the field of life science applications. The Nano2Life network of excellence is the perfect interface for ION-TOF to this field and a good environment for technical and application development. In this context, the focus is on applications such as bio-diagnostic, bio-sensory, cell analysis and drug delivery.
|
[
